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Delivery time: 1 ~ 2 weeks
Electron Probe X-ray Micro Analyzer is developed on the principles of electron optics and X-ray spectroscopy, it performs microscopic analysis of solid materials through the secondary electrons, back-scattered electrons, X-rays and other signals generated by the electron beam on the micro area of the sample, revealing the compositional, morphological and structural information.
Electron Probe X-ray Micro Analyzer is developed on the principles of electron optics and X-ray spectroscopy, it performs microscopic analysis of solid materials through the secondary electrons, back-scattered electrons, X-rays and other signals generated by the electron beam on the micro area of the sample, revealing the compositional, morphological and structural information.
Instrument Type:
| Analytical Program | Price (CHF/sample) |
|---|---|
| Qualitative point composition analysis (2 sites) | 80 |
| Line composition scanning | 80 |
| 2D composition mapping | 165 |
| Quantitative analysis | 80 |
The main components of X-ray Diffraction (XRD) include an X-ray source (produces X-rays), collimators/slits (control beam shape), sample holder (positions the sample), goniometer (rotates sample and detector), detector (records diffracted X-rays), monochromator (filters unwanted wavelengths), and computer/software (analyzes diffraction patterns for material identification).
Caption: EPMA line composition analysis
Caption: EPMA 2D composition mapping analysism
| Shape | Diameter | Height |
|---|---|---|
| Cylindrical | 18-25 mm | ~10 mm |
| Cylindrical | 25 mm or 32 mm | < 15 mm |
